XAFS-DET is a new generation of germanium detectors for X-rays spectroscopy application in the energy range of 5 to 100 keV. XAFS-DET provides higher throughput per unit area and an improved operation stability. Its design overcomes the limitations of current detector available in the market and opens new experimental possibilities, for example in the field of energy or environment where very low concentration of chemical species must be detected. The improvement in performance is based on its shrink seven sensor elements, which allow the operation of XAFS-DET very close to the sample, at throughput per unit area of 250 kcps/mm2. Germanium elements are equipped with a compact version of multi-channel CMOS integrated front-end electronics and read out by an advanced digital pulse processor.  The detector has a compact design, which includes a cryostat, a cooling system, and the electronics housing.